282 search results - page 36 / 57 » Reliability- and process-variation aware design of integrate... |
ICCAD
1997
IEEE
14 years 1 months ago
1997
IEEE
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
DAC
2005
ACM
13 years 11 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
ISCC
2000
IEEE
14 years 1 months ago
2000
IEEE
Ubiquitous communication will be one of the paradigms for the next decades. The use of the Internet in such applications demands for a highly reliable and secure system, especiall...
DAC
2002
ACM
14 years 10 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...