282 search results - page 44 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Increasing resistivity of copper with scaling and rising demands on current density requirements are driving the need to identify new wiring solutions for deep nanometer scale VLS...
COMCOM
2006
13 years 9 months ago
2006
Recent technological advances in sensors, low-power integrated circuits, and wireless communications have enabled the design of lowcost, miniature, lightweight, and intelligent ph...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
High efficiency low voltage DC-DC conversion is a key enabler to the design of power-efficient integrated circuits. Typically a star configuration of the DC-DC converters, where o...
ISPD
2010
ACM
14 years 3 months ago
2010
ACM
Obstacle-avoiding rectilinear Steiner minimal tree (OARSMT) construction is becoming one of the most sought after problems in modern design flow. In this paper we present FOARS, ...
ISLPED
2003
ACM
14 years 2 months ago
2003
ACM
Power dissipation is unevenly distributed in modern microprocessors leading to localized hot spots with significantly greater die temperature than surrounding cooler regions. Exc...