282 search results - page 48 / 57 » Reliability- and process-variation aware design of integrate... |
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
CASES
2009
ACM
14 years 1 months ago
2009
ACM
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
DAC
2010
ACM
14 years 9 days ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
DAC
2003
ACM
14 years 10 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
SENSYS
2004
ACM
14 years 2 months ago
2004
ACM
The enormous potential for wireless sensor networks to make a positive impact on our society has spawned a great deal of research on the topic, and this research is now producing ...