282 search results - page 49 / 57 » Reliability- and process-variation aware design of integrate... |
ASPDAC
2008
ACM
13 years 11 months ago
2008
ACM
Accurate modeling of delay, power, and area of interconnections early in the design phase is crucial for effective system-level optimization. Models presently used in system-level...
ISPD
2010
ACM
14 years 3 months ago
2010
ACM
Thermal/power issues have become increasingly important with more and more transistors being put on a single chip. Many dynamic thermal/power management techniques have been propo...
ISPD
2003
ACM
14 years 2 months ago
2003
ACM
We propose a method to capture crosstalk-induced noisy waveform for crosstalk-aware static timing analysis. The effects of capacitive coupling noise on timing are conventionally m...
ICCD
2008
IEEE
14 years 6 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
DAC
2006
ACM
14 years 2 months ago
2006
ACM
Silicon technology based nonvolatile memories (NVM) have achieved widespread adoption for code and data storage applications. In the last 30 years, the traditional floating gate ...