282 search results - page 55 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
IEEEPACT
2008
IEEE
14 years 1 months ago
2008
IEEE
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
ATAL
2010
Springer
13 years 8 months ago
2010
Springer
Service-oriented systems are becoming more and more nodes in a digital, dynamic ecosystem requiring the identification and establishment of flexible, spontaneous collaboration act...
CASCON
1992
13 years 8 months ago
1992
A multidatabase system (MDBS) is a facility that allows users access to data located in multiple autonomous database management systems (DBMSs). In such a system, globaltransaction...
MICRO
2009
IEEE
14 years 1 months ago
2009
IEEE
The phase-change random access memory (PRAM) technology is fast maturing to production levels. Main advantages of PRAM are non-volatility, byte addressability, in-place programmab...