41 search results - page 1 / 9 » Reliable Fault Diagnosis with Few Tests |
CPC
1998
13 years 10 months ago
1998
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
SIES
2007
IEEE
14 years 5 months ago
2007
IEEE
— In this paper we present an architecture for a test and diagnosis toolset for FlexRay-based automotive distributed networks. Next to data monitoring and recording, this toolset...
GLVLSI
2005
IEEE
14 years 4 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
DAC
2002
ACM
14 years 12 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...