29 search results - page 6 / 6 » Resistive Bridging Fault Simulation of Industrial Circuits |
EVOW
2001
Springer
13 years 12 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...