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DATE
2006
IEEE
14 years 23 days ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
ITC
2002
IEEE
13 years 11 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
ASPDAC
2005
ACM
13 years 8 months ago
2005
ACM
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
DFT
2002
IEEE
13 years 11 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...