341 search results - page 14 / 69 » Reusable test collections through experimental design |
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
SIGIR
2004
ACM
14 years 1 months ago
2004
ACM
As online document collections continue to expand, both on the Web and in proprietary environments, the need for duplicate detection becomes more critical. The goal of this work i...
GLVLSI
1998
IEEE
13 years 12 months ago
1998
IEEE
With the increased clock frequency of modern, high-performance processors over 500 MHz, in some cases, limiting the power dissipation has become the most stringent design target. ...