341 search results - page 46 / 69 » Reusable test collections through experimental design |
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
SENSYS
2010
ACM
13 years 5 months ago
2010
ACM
Wireless sensor networks (WSNs) are hard to program due to unconventional programming models used to satisfy stringent resource constraints. The common event-driven concurrent pro...
JAIR
2010
13 years 6 months ago
2010
Decentralized planning in uncertain environments is a complex task generally dealt with by using a decision-theoretic approach, mainly through the framework of Decentralized Parti...
BMCBI
2007
13 years 7 months ago
2007
Background: A nearly complete collection of gene-deletion mutants (96% of annotated open reading frames) of the yeast Saccharomyces cerevisiae has been systematically constructed....
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
Traditional circuit design focuses on optimizing the static critical paths no matter how infrequently these paths are exercised dynamically. Circuit optimization is then tuned to ...