167 search results - page 33 / 34 » Robust Techniques for Watermarking Sequential Circuit Design... |
IOLTS
2006
IEEE
14 years 4 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
ICCD
2008
IEEE
14 years 7 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
ISPD
2007
ACM
14 years 13 days ago
2007
ACM
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
IPPS
2010
IEEE
13 years 8 months ago
2010
IEEE
Abstract--The lag of parallel programming models and languages behind the advance of heterogeneous many-core processors has left a gap between the computational capability of moder...
TSMC
2008
13 years 10 months ago
2008
This paper proposes a type-2 self-organizing neural fuzzy system (T2SONFS) and its hardware implementation. The antecedent parts in each T2SONFS fuzzy rule are interval type-2 fuzz...