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DAC
2008
ACM
16 years 5 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2002
ACM
16 years 5 months ago
Scheduler-based DRAM energy management
Previous work on DRAM power-mode management focused on hardware-based techniques and compiler-directed schemes to explicitly transition unused memory modules to low-power operatin...
Victor Delaluz, Anand Sivasubramaniam, Mahmut T. K...
135
Voted
MICCAI
2002
Springer
16 years 5 months ago
Line Integral Convolution for Visualization of Fiber Tract Maps from DTI
Abstract. Diffusion tensor imaging (DTI) can provide the fundamental information required for viewing structural connectivity. However, robust and accurate acquisition and processi...
Tim McGraw, Baba C. Vemuri, Zhizhou Wang, Yunmei C...
ICML
2004
IEEE
16 years 5 months ago
Boosting margin based distance functions for clustering
The performance of graph based clustering methods critically depends on the quality of the distance function, used to compute similarities between pairs of neighboring nodes. In t...
Tomer Hertz, Aharon Bar-Hillel, Daphna Weinshall
141
Voted
WWW
2009
ACM
16 years 5 months ago
A trust management framework for service-oriented environments
Many reputation management systems have been developed under the assumption that each entity in the system will use a variant of the same scoring function. Much of the previous wo...
William Conner, Arun Iyengar, Thomas A. Mikalsen, ...
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