768 search results - page 26 / 154 » Robustness of Sequential Circuits |
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the r...
MTV
2007
IEEE
14 years 3 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
NECO
2008
13 years 8 months ago
2008
A new gradient technique is introduced for linear ICA based on the Edgeworth expansion of mutual information, for which the algorithm operates sequentially using fixed-point itera...
PAMI
2008
13 years 8 months ago
2008
This paper describes a method for robust real time pattern matching. We first introduce a family of image distance measures, the "Image Hamming Distance Family". Members ...
DAC
2009
ACM
14 years 3 months ago
2009
ACM
This paper proposes an equation-based multi-scenario iterative robust optimization methodology for analog/mixed-signal circuits. We show that due to local circuit performance mono...