768 search results - page 34 / 154 » Robustness of Sequential Circuits |
EVOW
2006
Springer
14 years 16 days ago
2006
Springer
Abstract. We motivate and describe an analog evolvable hardware design platform named GRACE (i.e. Generative Robust Analog Circuit Exploration). GRACE combines coarse-grained, topo...
ET
2007
13 years 8 months ago
2007
In this paper, different circuits of Quantum-dot Cellular Automata (QCA) are proposed for the so-called coplanar crossing. Coplanar crossing is one of the most interesting feature...
DSN
2008
IEEE
14 years 3 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
MR
2007
13 years 8 months ago
2007
CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...