768 search results - page 43 / 154 » Robustness of Sequential Circuits |
ICCAD
1997
IEEE
14 years 1 months ago
1997
IEEE
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
VTS
1996
IEEE
14 years 1 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
FORTE
1998
13 years 10 months ago
1998
: In this paper, we propose a technique for hardware implementation of protocol specifications in LOTOS. For the purpose, we define a new model called synchronous EFSMs consisting ...
DAC
2005
ACM
13 years 10 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...
TCAD
1998
13 years 8 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...