59 search results - page 6 / 12 » Runtime leakage power estimation technique for combinational... |
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
— For 65nm and below devices, even after optical proximity correction (OPC), the gate may still be non-rectangular. There are several limited works on the device and circuit char...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
Abstract— Thermal issues are a primary concern in the threedimensional (3D) integrated circuit (IC) design. Temperature, area, and wire length must be simultaneously optimized du...
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Low-power consumption has become a highly important concern for synchronous standard-cell design, and consequently mandates the use of low-power design methodologies and techni...