As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
In this paper we explore the use of a set of novel design metrics for characterizing the impact of gate oxide tunneling current in nanometer CMOS devices and perform Monte Carlo s...
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...
This paper presents the power and performance analysis of a digital, direct sequence ultra-wideband (DS-UWB) receiver operating in the 3 to 4 GHz band. The signal to noise and dis...
The growing gap between on-chip gates and off-chip I/O bandwidth argues for ever larger amounts of on-chip memory. Emerging portable consumer technology, such as digital cameras, ...