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» SOI Digital CMOS VLSI - a Design Perspective
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GLVLSI
2006
IEEE
193views VLSI» more  GLVLSI 2006»
14 years 1 months ago
Optimizing noise-immune nanoscale circuits using principles of Markov random fields
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
VLSID
2007
IEEE
85views VLSI» more  VLSID 2007»
14 years 7 months ago
Metrics to Quantify Steady and Transient Gate Leakage in Nanoscale Transistors: NMOS vs. PMOS Perspective
In this paper we explore the use of a set of novel design metrics for characterizing the impact of gate oxide tunneling current in nanometer CMOS devices and perform Monte Carlo s...
Elias Kougianos, Saraju P. Mohanty
ICCAD
1996
IEEE
151views Hardware» more  ICCAD 1996»
13 years 11 months ago
Expected current distributions for CMOS circuits
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...
Dennis J. Ciplickas, Ronald A. Rohrer
VLSID
2006
IEEE
134views VLSI» more  VLSID 2006»
14 years 7 months ago
ADC Precision Requirement for Digital Ultra-Wideband Receivers with Sublinear Front-Ends: A Power and Performance Perspective
This paper presents the power and performance analysis of a digital, direct sequence ultra-wideband (DS-UWB) receiver operating in the 3 to 4 GHz band. The signal to noise and dis...
Ivan Siu-Chuang Lu, Neil Weste, Sri Parameswaran
ARVLSI
1997
IEEE
105views VLSI» more  ARVLSI 1997»
13 years 11 months ago
An Embedded DRAM for CMOS ASICs
The growing gap between on-chip gates and off-chip I/O bandwidth argues for ever larger amounts of on-chip memory. Emerging portable consumer technology, such as digital cameras, ...
John Poulton