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DATE
1999
IEEE
102views Hardware» more  DATE 1999»
14 years 1 months ago
Minimal Length Diagnostic Tests for Analog Circuits using Test History
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
Alfred V. Gomes, Abhijit Chatterjee
SIGMOD
2011
ACM
283views Database» more  SIGMOD 2011»
12 years 12 months ago
iReduct: differential privacy with reduced relative errors
Prior work in differential privacy has produced techniques for answering aggregate queries over sensitive data in a privacypreserving way. These techniques achieve privacy by addi...
Xiaokui Xiao, Gabriel Bender, Michael Hay, Johanne...
ICPR
2008
IEEE
14 years 10 months ago
Refining PTZ camera calibration
Due to the increased need for security and surveillance, PTZ cameras are now being widely used in many domains. Therefore, it is very important for the applications like video mos...
Hassan Foroosh, Imran N. Junejo
ICML
2003
IEEE
14 years 10 months ago
Bayes Meets Bellman: The Gaussian Process Approach to Temporal Difference Learning
We present a novel Bayesian approach to the problem of value function estimation in continuous state spaces. We define a probabilistic generative model for the value function by i...
Yaakov Engel, Shie Mannor, Ron Meir
FSKD
2005
Springer
95views Fuzzy Logic» more  FSKD 2005»
14 years 2 months ago
The Fuzzy Mega-cluster: Robustifying FCM by Scaling Down Memberships
A new robust clustering scheme based on fuzzy c-means is proposed and the concept of a fuzzy mega-cluster is introduced in this paper. The fuzzy mega-cluster is conceptually simila...
Amit Banerjee, Rajesh N. Davé