Sciweavers

102 search results - page 5 / 21
» Scalable techniques and tools for reliability analysis of la...
Sort
View
FGCS
2006
135views more  FGCS 2006»
13 years 8 months ago
Scaling applications to massively parallel machines using Projections performance analysis tool
Some of the most challenging applications to parallelize scalably are the ones that present a relatively small amount of computation per iteration. Multiple interacting performanc...
Laxmikant V. Kalé, Gengbin Zheng, Chee Wai ...
DAC
2009
ACM
14 years 9 months ago
Spectral techniques for high-resolution thermal characterization with limited sensor data
Elevated chip temperatures are true limiters to the scalability of computing systems. Excessive runtime thermal variations compromise the performance and reliability of integrated...
Ryan Cochran, Sherief Reda
GECCO
2008
Springer
172views Optimization» more  GECCO 2008»
13 years 9 months ago
Empirical analysis of a genetic algorithm-based stress test technique
Evolutionary testing denotes the use of evolutionary algorithms, e.g., Genetic Algorithms (GAs), to support various test automation tasks. Since evolutionary algorithms are heuris...
Vahid Garousi
ICCAD
1994
IEEE
115views Hardware» more  ICCAD 1994»
14 years 20 days ago
Fast transient power and noise estimation for VLSI circuits
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
Wolfgang T. Eisenmann, Helmut E. Graeb
DAC
2006
ACM
14 years 2 months ago
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
Rakesh Vattikonda, Wenping Wang, Yu Cao