This work evaluates task allocation strategies based on bin-packing algorithms in the context of multiprocessor systems-on-chip (MPSoCs) with task migration capabilities, running ...
With the shrinking of technology feature sizes, the share of leakage in total power consumption of digital systems continues to grow. Traditional dynamic voltage scaling (DVS) fail...
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
Jason A. Blome, Shantanu Gupta, Shuguang Feng, Sco...
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
Avi Timor, Avi Mendelson, Yitzhak Birk, Neeraj Sur...