Abstract. In this paper we propose a new method to perform incremental discretization. The basic idea is to perform the task in two layers. The first layer receives the sequence o...
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
Michael J. Knieser, Francis G. Wolff, Christos A. ...
This paper introduces a single-key text entry application for users with severe physical impairments. The tool combines the idea of a scanning ambiguous keyboard (which promises un...
Torsten Felzer, I. Scott MacKenzie, Philipp Becker...