173 search results - page 22 / 35 » Scan Architecture With Align-Encode |
SAC
2006
ACM
14 years 2 months ago
2006
ACM
Abstract. In this paper we propose a new method to perform incremental discretization. The basic idea is to perform the task in two layers. The first layer receives the sequence o...
ATS
2005
IEEE
14 years 2 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
ATS
2003
IEEE
14 years 1 months ago
2003
IEEE
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
ICCHP
2010
Springer
14 years 1 months ago
2010
Springer
This paper introduces a single-key text entry application for users with severe physical impairments. The tool combines the idea of a scanning ambiguous keyboard (which promises un...