—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
— Y -interconnects for VLSI chips are based on the use of global and semi-global wiring in only 0◦ , 60◦ , and 120◦ . Though X-interconnects are fast replacing the traditio...
Abstract. We study in this lecture the literature on mixed integer programming models and formulations for a specific problem class, namely deterministic production planning probl...
Agent-based approaches to manufacturing scheduling and control have gained increasing attention in recent years. Such approaches are attractive because they o er increased robustn...