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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
13 years 11 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
CCS
2011
ACM
12 years 7 months ago
Fear the EAR: discovering and mitigating execution after redirect vulnerabilities
The complexity of modern web applications makes it difficult for developers to fully understand the security implications of their code. Attackers exploit the resulting security v...
Adam Doupé, Bryce Boe, Christopher Kruegel,...
TISSEC
2008
235views more  TISSEC 2008»
13 years 7 months ago
SDAP: A Secure Hop-by-Hop Data Aggregation Protocol for Sensor Networks
Hop-by-hop data aggregation is a very important technique for reducing the communication overhead and energy expenditure of sensor nodes during the process of data collection in a...
Yi Yang, Xinran Wang, Sencun Zhu, Guohong Cao
ISSA
2004
13 years 8 months ago
Utilizing Neural Networks For Effective Intrusion Detection
Computer security, and intrusion detection in particular, has become increasingly important in today's business environment, to help ensure safe and trusted commerce between ...
Martin Botha
CODES
2004
IEEE
13 years 11 months ago
Power analysis of system-level on-chip communication architectures
For complex System-on-chips (SoCs) fabricated in nanometer technologies, the system-level on-chip communication architecture is emerging as a significant source of power consumpti...
Kanishka Lahiri, Anand Raghunathan