376 search results - page 11 / 76 » Self-Assembled Circuit Patterns |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
ISCAS
1999
IEEE
13 years 11 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
ICCAD
1997
IEEE
13 years 11 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...