376 search results - page 17 / 76 » Self-Assembled Circuit Patterns |
TCAD
1998
13 years 7 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...
DSD
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
ICIP
2006
IEEE
14 years 9 months ago
2006
IEEE
We present in this paper a method for implementing moment functions in a CMOS retina for shape recognition applications. The method is based on the use of binary patterns and it a...