376 search results - page 22 / 76 » Self-Assembled Circuit Patterns |
VLSID
2003
IEEE
14 years 8 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...
EH
1999
IEEE
13 years 12 months ago
1999
IEEE
GeneticFPGA is a Java-based tool for evolving digital circuits on Xilinx XC4000EXTM and XC4000XLTM devices. Unlike other FPGA architectures popular with Evolutionary Hardware rese...
JCNS
2010
13 years 2 months ago
2010
The early processing of sensory information by neuronal circuits often includes a reshaping of activity patterns that may facilitate the further processing of stimulus representat...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
This paper describes a diagnosis technique for locating design errors in circuit implementations which do not match their functional specification. The method efficiently propagat...