376 search results - page 48 / 76 » Self-Assembled Circuit Patterns |
VTS
2003
IEEE
14 years 26 days ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
SIGIR
2003
ACM
14 years 25 days ago
2003
ACM
A novel Hardware Assisted Top-Doc (HAT) component is disclosed. HAT is an optimized content indexing device based on a modified inverted index structure. HAT accommodates patterns...
AAAI
2008
13 years 10 months ago
2008
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
DAC
2001
ACM
14 years 8 months ago
2001
ACM
We propose a new BDD-based method for decomposition of multi-output incompletely specified logic functions into netlists of two-input logic gates. The algorithm uses the internal ...