376 search results - page 51 / 76 » Self-Assembled Circuit Patterns |
ISCAS
2006
IEEE
14 years 1 months ago
2006
IEEE
— We propose a character size optimization technique to enhance the throughput of maskless lithography as well as photomask manufacture. The number of electron beam shots to draw...
AUTOID
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we analyze impedance matching concepts in passive radio frequency identification (RFID) transponders, which are powered by the incoming RF energy and consist of an...
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...
DAC
2000
ACM
13 years 12 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...