1287 search results - page 28 / 258 » Self-Normalized Linear Tests |
VTS
2003
IEEE
14 years 1 months ago
2003
IEEE
STOC
2010
ACM
14 years 16 days ago
2010
ACM
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
APPROX
2008
Springer
13 years 9 months ago
2008
Springer
We consider testing directed graphs for being Eulerian in the orientation model introduced in [15]. Despite the local nature of the property of being Eulerian, it turns out to be ...
ASPDAC
1998
ACM
13 years 12 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...