1287 search results - page 45 / 258 » Self-Normalized Linear Tests |
IROS
2007
IEEE
14 years 2 months ago
2007
IEEE
— This work is focused on the design of a rotor speed regulator for small-scale helicopters. A nominal model identification for the main rotor is performed using a hybrid proced...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bitor word-oriented and...
CVPR
2011
IEEE
13 years 3 months ago
2011
IEEE
Recently the sparse representation (or coding) based classification (SRC) has been successfully used in face recognition. In SRC, the testing image is represented as a sparse lin...
SIMPRA
2011
13 years 2 months ago
2011
We propose a method to detect the onset of linear trend in a time series and estimate the change point T from the profile of a linear trend test statistic, computed on consecutive...