1287 search results - page 85 / 258 » Self-Normalized Linear Tests |
PVG
2003
IEEE
14 years 1 months ago
2003
IEEE
Parallel volume rendering offers a feasible solution to the large data visualization problem by distributing both the data and rendering calculations among multiple computers con...
VTS
2002
IEEE
14 years 24 days ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
ISSAC
2009
Springer
14 years 2 months ago
2009
Springer
We address complexity issues for linear differential equations in characteristic p > 0: resolution and computation of the p-curvature. For these tasks, our main focus is on al...
ECCC
2011
13 years 2 months ago
2011
Polynomial identity testing (PIT) problem is known to be challenging even for constant depth arithmetic circuits. In this work, we study the complexity of two special but natural ...
APPROX
2009
Springer
14 years 2 months ago
2009
Springer
Motivated by questions in property testing, we search for linear error-correcting codes that have the “single local orbit” property: i.e., they are specified by a single loca...