Sciweavers

1287 search results - page 8 / 258
» Self-Normalized Linear Tests
Sort
View
DAC
1998
ACM
13 years 12 months ago
Efficient Analog Test Methodology Based on Adaptive Algorithms
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
Luigi Carro, Marcelo Negreiros
PAMI
2006
114views more  PAMI 2006»
13 years 7 months ago
Nonparametric Supervised Learning by Linear Interpolation with Maximum Entropy
Nonparametric neighborhood methods for learning entail estimation of class conditional probabilities based on relative frequencies of samples that are "near-neighbors" of...
Maya R. Gupta, Robert M. Gray, Richard A. Olshen
VTS
2006
IEEE
116views Hardware» more  VTS 2006»
14 years 1 months ago
Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding
A technique is presented here for improving the compression achieved with any linear decompressor by adding a small non-linear decoder that exploits bit-wise and pattern-wise corr...
Jinkyu Lee, Nur A. Touba
STACS
2009
Springer
14 years 2 months ago
Testing Linear-Invariant Non-Linear Properties
Arnab Bhattacharyya, Victor Chen, Madhu Sudan, Nin...
ICCAD
2004
IEEE
101views Hardware» more  ICCAD 2004»
14 years 4 months ago
Frugal linear network-based test decompression for drastic test cost reductions
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
Wenjing Rao, Alex Orailoglu, G. Su