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VTS
2003
IEEE
95views Hardware» more  VTS 2003»
14 years 1 months ago
Built-In Reseeding for Serial Bist
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
Ahmad A. Al-Yamani, Edward J. McCluskey
CASES
2003
ACM
14 years 1 months ago
Polynomial-time algorithm for on-chip scratchpad memory partitioning
Focusing on embedded applications, scratchpad memories (SPMs) look like a best-compromise solution when taking into account performance, energy consumption and die area. The main ...
Federico Angiolini, Luca Benini, Alberto Caprara
KCAP
2003
ACM
14 years 1 months ago
Learning programs from traces using version space algebra
While existing learning techniques can be viewed as inducing programs from examples, most research has focused on rather narrow classes of programs, e.g., decision trees or logic ...
Tessa A. Lau, Pedro Domingos, Daniel S. Weld
ASIAMS
2009
IEEE
14 years 1 months ago
Evolutionary-Reduced Ordered Binary Decision Diagram
—Reduced ordered binary decision diagram (ROBDD) is a memory-efficient data structure which is used in many applications such as synthesis, digital system, verification, testing ...
Hossein Moeinzadeh, Mehdi Mohammadi, Hossein Pazho...
COMPSAC
2002
IEEE
14 years 29 days ago
Formalizing Incremental Design in Real-time Area: SCTL/MUS-T
Achievement of quality in software design, while never easy, is made more difficult by the inherent complexity of hard real-time (HRT) design. Furthermore, timing requirements in...
Ana Fernández Vilas, José J. Pazos A...