171 search results - page 23 / 35 » Sensitivity analysis in decision circuits |
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
As the portion of coupling capacitance increases in smaller process geometries, accurate coupled noise analysis is becoming more important in current design methodologies. We prop...
ICCAD
2008
IEEE
14 years 6 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
ISLPED
1997
ACM
14 years 1 months ago
1997
ACM
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...
ICCD
2006
IEEE
14 years 6 months ago
2006
IEEE
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...