49 search results - page 6 / 10 » Sensitivity-Based Gate Delay Propagation in Static Timing An... |
TCAD
2010
13 years 2 months ago
2010
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
DATE
2010
IEEE
14 years 22 days ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Continuing scaling of CMOS technology has allowed aggressive pursuant of increased clock rate in DSM chips. The ever shorter clock period has made switching times of di...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...