42 search results - page 6 / 9 » Signature Rollback - A Technique for Testing Robust Circuits |
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die va...
IOLTS
2006
IEEE
14 years 1 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
ACSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
Software security assurance and malware (trojans, worms, and viruses, etc.) detection are important topics of information security. Software obfuscation, a general technique that ...
IOLTS
2000
IEEE
14 years 5 days ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
ET
2010
13 years 6 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...