— An elevated central-channel doping with a depth similar to the S/D junctions is proposed as the best measure for simultaneously improving MOSFET device and high speed circuit p...
Masayasu Tanaka, N. Tokida, T. Okagaki, Michiko Mi...
This paper presents an approach to the analysis of transient thermal states in electronic circuits using an analytical solution of the heat equation. Fully three-dimensional analy...
Marcin Janicki, Gilbert De Mey, Andrzej Napieralsk...
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
— Integrated circuits have evolved to a stage where interconnections significantly limit their performance and functional complexity. We introduce a set of tools to perform high...
Rui Martins, Wolfgang Pyka, Rainer Sabelka, Siegfr...
In this paper we propose a novel parameterized macromodeling technique for analog circuits. Unlike traditional macromodels that are only extracted for a small variation space, our...