1304 search results - page 194 / 261 » Simulation of Soliton Circuits |
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
ISCAS
2003
IEEE
14 years 2 months ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
ISCAS
2003
IEEE
14 years 2 months ago
2003
IEEE
High frequency digital LSIs usually consist of many subcircuits coupled with multi-conductor interconnects embedded in the substrate. They sometimes cause serious problems of the ...
ISCAS
2003
IEEE
14 years 2 months ago
2003
IEEE
Tunneling based random-access memories (TRAM’s) have recently garnered a great amount of interests among the memory designers due to their intrinsic merits such as reduced power...
VTS
2003
IEEE
14 years 2 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...