—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
— Environments with varying reward contingencies constitute a challenge to many living creatures. In such conditions, animals capable of adaptation and learning derive an advanta...
Leakage power dissipation is one of the most critical factors for the overall current dissipation and future designs. However, design techniques for the reduction of leakage power...
- We present an application of a massively parallel processor array VLSI circuit to the implementation of neural networks in complex architectural arrangements. The work was motiva...
David R. W. Barr, Piotr Dudek, Jonathan M. Chamber...
Due to the roaring power dissipation and gaining popularity of 3D integration, thermal dissipation has been a critical concern of modern VLSI design. The availability for chip-lev...