1304 search results - page 223 / 261 » Simulation of Soliton Circuits |
VTS
2008
IEEE
14 years 3 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
CEC
2007
IEEE
14 years 3 months ago
2007
IEEE
— Environments with varying reward contingencies constitute a challenge to many living creatures. In such conditions, animals capable of adaptation and learning derive an advanta...
GLVLSI
2007
IEEE
14 years 3 months ago
2007
IEEE
Leakage power dissipation is one of the most critical factors for the overall current dissipation and future designs. However, design techniques for the reduction of leakage power...
IJCNN
2007
IEEE
14 years 3 months ago
2007
IEEE
- We present an application of a massively parallel processor array VLSI circuit to the implementation of neural networks in complex architectural arrangements. The work was motiva...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
Due to the roaring power dissipation and gaining popularity of 3D integration, thermal dissipation has been a critical concern of modern VLSI design. The availability for chip-lev...