3507 search results - page 651 / 702 » Slicing for architectural analysis |
164
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DAC
2007
ACM
16 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
177
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DAC
2002
ACM
16 years 6 months ago
2002
ACM
Previous work on DRAM power-mode management focused on hardware-based techniques and compiler-directed schemes to explicitly transition unused memory modules to low-power operatin...
161
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DAC
2002
ACM
16 years 6 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
157
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DAC
2002
ACM
16 years 6 months ago
2002
ACM
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
132
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DAC
2003
ACM
16 years 6 months ago
2003
ACM
Delay budget is an excess delay each component of a design can tolerate under a given timing constraint. Delay budgeting has been widely exploited to improve the design quality. W...