205 search results - page 9 / 41 » SoC Design and Test Considerations |
FMCAD
2007
Springer
13 years 10 months ago
2007
Springer
In today's SoC design cycles, debugging is one of the most time consuming manual tasks. CAD solutions strive to reduce the inefficiency of debugging by identifying error sourc...
DELTA
2008
IEEE
14 years 1 months ago
2008
IEEE
The advances of CMOS technology towards 45 nm, the high costs of ASIC design, power limitations and fast changing application requirements have stimulated the usage of highly reco...
DATE
2002
IEEE
13 years 11 months ago
2002
IEEE
This paper proposes a comprehensive model for test planning in a core-based environment. The main contribution of this work is the use of several types of TAMs and the considerati...
DATE
2004
IEEE
13 years 10 months ago
2004
IEEE
There has been considerable research on quantum dots cellular automata as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is a majorit...
ICCD
2008
IEEE
14 years 3 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...