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» Soft Error Rates with Inertial and Logical Masking
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DSN
2008
IEEE
13 years 9 months ago
An accurate flip-flop selection technique for reducing logic SER
The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In...
Eric L. Hill, Mikko H. Lipasti, Kewal K. Saluja
IOLTS
2008
IEEE
102views Hardware» more  IOLTS 2008»
14 years 1 months ago
Integrating Scan Design and Soft Error Correction in Low-Power Applications
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
Michael E. Imhof, Hans-Joachim Wunderlich, Christi...
HPCA
2009
IEEE
14 years 8 months ago
Eliminating microarchitectural dependency from Architectural Vulnerability
The Architectural Vulnerability Factor (AVF) of a hardware structure is the probability that a fault in the structure will affect the output of a program. AVF captures both microa...
Vilas Sridharan, David R. Kaeli
ISQED
2008
IEEE
186views Hardware» more  ISQED 2008»
14 years 1 months ago
Reliability-Aware Optimization for DVS-Enabled Real-Time Embedded Systems
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
Foad Dabiri, Navid Amini, Mahsan Rofouei, Majid Sa...
IOLTS
2008
IEEE
83views Hardware» more  IOLTS 2008»
14 years 1 months ago
On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD
Sets of Pairs of Functions to be Distinguished (SPFD) is a functional flexibility representation method that was recently introduced in the logic synthesis domain, and promises s...
Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, ...