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» Soft delay error analysis in logic circuits
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DAC
2009
ACM
14 years 8 months ago
Improving testability and soft-error resilience through retiming
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
Smita Krishnaswamy, Igor L. Markov, John P. Hayes
ICCD
2005
IEEE
116views Hardware» more  ICCD 2005»
14 years 4 months ago
Enhanced Dual-Transition Probabilistic Power Estimation with Selective Supergate Analysis
Consideration of pairs of transition in probabilistic simulation allows power estimation for digital circuits in which inertial delays can filter glitches [5]. However, the merit ...
Fei Hu, Vishwani D. Agrawal
ASPDAC
2004
ACM
126views Hardware» more  ASPDAC 2004»
14 years 1 months ago
High-level area and power-up current estimation considering rich cell library
— Reducing the ever-growing leakage power is critical to power efficient designs. Leakage reduction techniques such as power-gating using sleep transistor insertion introduces la...
Fei Li, Lei He, Joseph M. Basile, Rakesh J. Patel,...
FPL
2008
Springer
143views Hardware» more  FPL 2008»
13 years 9 months ago
Fast toggle rate computation for FPGA circuits
This paper presents a fast and scalable method of computing signal toggle rate in FPGA-based circuits. Our technique is a vectorless estimation technique, which can be used in a C...
Tomasz S. Czajkowski, Stephen Dean Brown
ATS
2003
IEEE
75views Hardware» more  ATS 2003»
14 years 1 months ago
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer