155 search results - page 9 / 31 » Soft delay error analysis in logic circuits |
TVLSI
2008
13 years 7 months ago
2008
Abstract--The quantum-dot cellular automata (QCA) model offers a novel nano-domain computing architecture by mapping the intended logic onto the lowest energy configuration of a co...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
IOLTS
2007
IEEE
14 years 2 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
ISVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...