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IOLTS
2007
IEEE
14 years 4 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
IPPS
2007
IEEE
14 years 4 months ago
2007
IEEE
The rapid revolution in microprocessor chip architecture due to multicore technology is presenting unprecedented challenges to the application developers as well as system softwar...
IPPS
2007
IEEE
14 years 4 months ago
2007
IEEE
High-end computing is universally recognized to be a strategic tool for leadership in science and technology. A significant portion of high-end computing is conducted on clusters...
MICRO
2007
IEEE
14 years 4 months ago
2007
IEEE
Single-threaded programming is already considered a complicated task. The move to multi-threaded programming only increases the complexity and cost involved in software developmen...
SECON
2007
IEEE
14 years 4 months ago
2007
IEEE
Abstract—While mechanisms exist to instantiate common security functionality such as confidentiality and integrity, little has been done to define a mechanism for identificati...