356 search results - page 35 / 72 » Solving the Small Sample Size Problem of LDA |
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
IMC
2005
ACM
14 years 1 months ago
2005
ACM
Flow measurement evolved into the primary method for measuring the composition of Internet traffic. Large ISPs and small networks use it to track dominant applications, dominant ...
PR
2006
13 years 7 months ago
2006
One of the main challenges faced by the current face recognition techniques lies in the difficulties of collecting samples. Fewer samples per person mean less laborious effort for...
ICIP
2010
IEEE
13 years 5 months ago
2010
IEEE
Optical lithography is a critical step in the semiconductor manufacturing process, and one key problem is the design of the photomask for a particular circuit pattern, given the o...
GECCO
2004
Springer
14 years 29 days ago
2004
Springer
Go remains a challenge for artificial intelligence. Currently, most machine learning methods tackle Go by playing on a specific fixed board size, usually smaller than the standa...