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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
SPAA
1995
ACM
13 years 11 months ago
Accounting for Memory Bank Contention and Delay in High-Bandwidth Multiprocessors
For years, the computation rate of processors has been much faster than the access rate of memory banks, and this divergence in speeds has been constantly increasing in recent yea...
Guy E. Blelloch, Phillip B. Gibbons, Yossi Matias,...
VISSYM
2007
13 years 10 months ago
Parametric Visualization of High Resolution Correlated Multi-spectral Features Using PCA
An imaging mass spectrometer is an analytical instrument that can determine the spatial distribution of chemical compounds on complex surfaces. The output of the device is a multi...
Alexander Broersen, Robert van Liere, Ron M. A. He...
AAAI
2007
13 years 10 months ago
Predictive Exploration for Autonomous Science
Often remote investigations use autonomous agents to observe an environment on behalf of absent scientists. Predictive exploration improves these systems’ efficiency with onboa...
David R. Thompson
APGV
2008
ACM
193views Visualization» more  APGV 2008»
13 years 10 months ago
Probing dynamic human facial action recognition from the other side of the mean
Insights from human perception of moving faces have the potential to provide interesting insights for technical animation systems as well as in the neural encoding of facial expre...
Cristóbal Curio, Martin A. Giese, Martin Br...