509 search results - page 20 / 102 » Standardization and Testing of Mathematical Functions |
114
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CEC
2007
IEEE
15 years 6 months ago
2007
IEEE
In this paper we derive a simpler form of Particle Swarm Optimiser (PSO) which still retains the key properties of the original model. We do so by progressively altering the origin...
100
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DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...
69
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DATE
2007
IEEE
15 years 9 months ago
2007
IEEE
∗ This paper presents an analysis of the electrical origins of Slow Write Driver Faults (SWDFs) [1] that may affect SRAM write drivers in 65nm technology. This type of fault is t...
135
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VTS
2003
IEEE
15 years 8 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
99
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BIOSYSTEMS
2007
15 years 2 months ago
2007
The Kolmogorov–Smirnov test determines the consistency of empirical data with a particular probability distribution. Often, parameters in the distribution are unknown, and have ...