125 search results - page 5 / 25 » Static Estimation of Test Coverage |
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature R...
ITC
2003
IEEE
14 years 24 days ago
2003
IEEE
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...