1599 search results - page 47 / 320 » Statistic Analysis for Probabilistic Processes |
TSP
2011
13 years 3 months ago
2011
—Detection of the number of sinusoids embedded in noise is a fundamental problem in statistical signal processing. Most parametric methods minimize the sum of a data fit (likeli...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
COLT
2004
Springer
14 years 2 months ago
2004
Springer
Abstract. The Gram matrix plays a central role in many kernel methods. Knowledge about the distribution of eigenvalues of the Gram matrix is useful for developing appropriate model...
ICCAD
2005
IEEE
14 years 6 months ago
2005
IEEE
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
PE
2007
Springer
13 years 8 months ago
2007
Springer
Grid computing is an emerging technology by which huge numbers of processors over the world create a global source of processing power. Their collaboration makes it possible to pe...